Patentethik
Überwachung
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Trivial
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Unverständlich

Patentüberwachung

patentverein.de legt einen Teil seiner monatlich durchgeführten Patentüberwachung offen, die Patente im Bereich der Antriebstechnik, Sensorik, Automation betreffen (IPC-Klassen G01B3, G01B5, G01B7, G01B11, G01B21, G01D5). Gelistet werden erteilte Patente (DE, EP, WO), die sich noch in der Einspruchsfrist befinden (DE = 3, EP = 9 Monate), sortiert nach Anmeldern mit der jeweiligen Anzahl der Patente.

Weitere auch namentliche Überwachungen auf Anmeldungen und Offenlegungen sowie Kommentare, Rechtsstands-Recherchen und Schriftsätze sind dem geschützten Mitgliederbereich zugewiesen.


Spezielle Auswahlen

Neue Erteilungen (aktuelle monatliche Erfassung) (55)

Anmelder (Anzahl erteilter Patente in der Einspruchsfrist)

Mitutoyo Corporation (10)
Siemens AG (6)
Carl Zeiss Industrielle Messtechnik GmbH (5)
Kanagawa 213-8533 (4)
NXP B.V. (4)
SICK AG (4)
ALPS ELECTRIC CO. (3)
Dr. Johannes Heidenhain GmbH (3)
FANUC CORPORATION (3)
Minamitsuru-gun, (3)
Ota-ku, Tokyo 145-8501 (3)
Otsuka-cho, (3)
Renishaw plc (3)
Takatsu-ku, Kawasaki-shi (3)
Takatsuku, Kawasaki-shi (3)
Yamanashi 401-0597 (3)
Co. KG (2)
DENSO CORPORATION (2)
Honda Motor Co. (2)
IDENT Technology AG (2)
Kanagawa-ken 213-8533 (2)
Kawasaki-shi, Kanagawa 213-8533 (2)
MARPOSS SOCIETA' PER AZIONI (2)
Panasonic Corporation (2)
Pepperl + (2)
ROBERT BOSCH GMBH (2)
S.N.R. ROULEMENTS (2)
Sirona Dental Systems GmbH (2)
Takatsu-ku, (2)
Wotton-under-Edge, Gloucestershire GL12 8JR (2)
(Compagnie Générale d'Optique) (1)
1-5-1 Marunouchi (1)
16 Richmond Street (1)
2-4-1, Hamamatsu-cho (1)
20, Yeouido-dong (1)
3-chome, Hirakata-shi (1)
3D SCANNERS LTD (1)
601-8036, JP (1)
Adga Adolf Gampper GmbH (1)
AfM Technology GmbH (1)
Aichi-pref. 445-0012 (1)
Aichi-pref. 448-8661 (1)
Aichi-pref., 448-0029 (1)
Alnair Laboratories Corp. (1)
ALSTOM Transport SA (1)
Antonis, Jan (1)
Apdo. 213 (1)
Asahi Glass Company (1)
ASM Assembly Systems GmbH & (1)
ASM AUTOMATION (1)
ASM Automation Sensorik Meßtechnik GmbH (1)
AUDI AG (1)
Avago Technologies ECBU IP (Singapore) Pte. Ltd. (1)
Barea, Tiziano (1)
BASF SE (1)
Bathium Canada Inc. (1)
Baumer Innotec AG (1)
Bayerische Motoren Werke Aktiengesellschaft (1)
Blüml, Marcus (1)
BorgWarner BERU Systems GmbH (1)
Bosch Rexroth AG (1)
Bridgestone Corporation (1)
BT9 7BB (1)
Bundesrepublik Deutschland (1)
CANON KABUSHIKI KAISHA (1)
Carneiro, (1)
Chuan Hong Precision Tool Manufacturing Co. (1)
Chuo-ku, (1)
Chuo-Ku, Tokyo 104-0031 (1)
cleo Empresarial de Mafra (1)
Continental Automotive Systems US (1)
Creaform Inc. (1)
Daktronics, Inc. (1)
Dalseo-Gu, Daegu 704-900 (1)
Daprox AB (1)
DE74 2SA (1)
Derby, (1)
Diatest Hermann Költgen GmbH (1)
Draka Cable Wuppertal GmbH (1)
E Sistemas Tecnoló (1)
E.G.O. ELEKTRO-GERÄTEBAU GmbH (1)
EM Microelectronic-Marin SA (1)
Essex SS6 7XD (1)
ESSILOR INTERNATIONAL (1)
ESW GmbH (1)
Ewert Place (1)
Fagor, S. Coop. (1)
Faro Technologies (1)
FESTO AG & Co. KG (1)
FIBERLAKE S.A. (1)
FISCO TOOLS LIMITED (1)
Ford Global Technologies (1)
Fröhlich GmbH (1)
Franke, Matthias (1)
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. (1)
Fraz. Montale (1)
Fuchs Drehgeber GmbH (1)
Fuchs GmbH (1)
GENERAL ELECTRIC COMPANY (1)
gicos, Lda. (1)
Gloucestershire GL12 8JR (1)
Hacmann, Hartmut (1)
Heidelberg Instruments Mikrotechnik GmbH (1)
Hexagon Metrology S.p.A. (1)
Honeywell International Inc. (1)
Horikawahigashiiru, (1)
Howard, Mark Anthony (1)
IMSTec GmbH (1)
in-situ GmbH (1)
International Business Machines Corporation (1)
ISIS INNOVATION LIMITED (1)
JOBS S.p.A. (1)
Jos. Schneider Optische Werke GmbH (1)
JTEKT CORPORATION (1)
Jtekt Europe (1)
JVM Co. (1)
Kanagawa-ken 213-0012 (1)
KAYABA INDUSTRY CO. (1)
Kita-ku, Osaka-shi (1)
Kovari, Kalman (1)
Krones AG (1)
Kyoto, (1)
Lang, Ralf (1)
Leica Geosystems AG (1)
Leuze electronic GmbH + Co. KG (1)
LG Electronics Inc. (1)
Liebherr-Werk Ehingen GmbH (1)
LKT GmbH (1)
Mehnert, Walter (1)
MELECS EWS GmbH & Co KG (1)
Metronom U.S. (1)
Micro-Epsilon Messtechnik GmbH & Co. KG (1)
Micro-Epsilon Messtechnik GmbH & (1)
Micronas GmbH (1)
Minami-ku, Kyoto-shi (1)
MITSUBISHI DENKI KABUSHIKI KAISHA (1)
motiondrive AG (1)
MURATEC-KDS CORP (1)
NAKANISHI METAL WORKS CO. (1)
NEM - Nú (1)
NGRID Intellectual Property Limited (1)
NIPPON SOKEN (1)
Nishi-ku, (1)
No 21-01 OUB Centre (1)
NTN Corporation (1)
Ohta-ku, Tokyo (1)
OMRON CORPORATION (1)
One Parklane Boulevard (1)
Optel Thevon (1)
Optoplan AS (1)
os De Engenharia (1)
Osaka 573-1132 (1)
OTSUKA ELECTRONICS CO. (1)
Oxford OX2 7SG (1)
P.O. Box 5128 (1)
Pav. 36-A (1)
Pepperl & Fuchs GmbH (1)
Peugeot Citroën Automobiles SA (1)
Quantum Precision Instruments Asia Pte Ltd (1)
Reiter, Mathias (1)
Rolls-Royce plc (1)
s, s/n (1)
Shimogyo-ku, Kyoto-shi (1)
Shimohasumi-cho, Nishio-city (1)
Shiokoji-dori, (1)
SICK STEGMANN GmbH (1)
Snap-on Equipment Srl a unico socio (1)
Somfy SAS (1)
Sony Deutschland GmbH (1)
Sony Electronics (1)
STOTZ FEINMESSTECHNIK GmbH (1)
Takatsu ku (1)
Takatsu-ku, Kawasaki (1)
Technische Universität Ilmenau (1)
Tecnoveritas - Serviç (1)
TELEFLEX INCORPORATED (1)
Tenaris Connections Aktiengesellschaft (1)
Tenaris Connections Limited (1)
The Boeing Company (1)
Theil, Thomas (1)
Tiax LLC (1)
Tienliao Township (1)
Tokyo 100-8310 (1)
Tokyo 100-8405 (1)
Tokyo 105-6190 (1)
Tokyo 107-8556 (1)
Tokyo 141-0001 (1)
Toshiba Elevator Kabushiki Kaisha (1)
Toshiba Kikai K.K. (1)
University of Strathclyde (1)
Verdtech Nuevo Campo (1)
Vistec Semiconductor Systems GmbH (1)
Voith Patent GmbH (1)
VOLVO LASTVAGNAR AB (1)
WC2N 5EH (1)
Yasumi Capital (1)
Youngdungpo-gu, Seoul 150-721 (1)
Z-Laser Optoelektronik GmbH (1)
Zoller & (1)
Zumbach Electronic Ag (1)
ZYGO CORPORATION (1)

Internationale Patentklassifikation (IPC)

G01D005Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable (Details)
G01B011Measuring arrangements characterised by the use of optical means (Details)
G01B007Measuring arrangements characterised by the use of electric or magnetic means (Details)
G01B021Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the preceding groups (Details)
G01B005Measuring arrangements characterised by the use of mechanical means (Details)
G01B003Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (Details)